Prediction of edge energy level at mineral-solution interface by means of zeta potential

被引:0
|
作者
Chen, JH
Feng, QM
Lu, YP
Ou, LM
Ma, YZ
机构
[1] Guangxi Univ, Coll Resources & Environm, Nanning 530004, Peoples R China
[2] Cent S Univ Technol, Dept Mineral Engn, Changsha 410083, Peoples R China
关键词
energy band model; semiconductor; electrochemical double layer;
D O I
暂无
中图分类号
TF [冶金工业];
学科分类号
0806 ;
摘要
A new method based on electrochemical double layer model is put forward to calculate edge level at the semiconductor-solution interface. Fermi level and edge level of semiconductor in solution are required to build energy band model. Edge level of semiconductor is very difficult to be measured directly in the process of sulfide flotation, so it is necessary to predict the value of edge level from theory. Then the theoretical prediction of edge level is simplified by means of zeta potential, which is easy to be measured and often used in flotation. According to this model, parameters of flotation solution, such as zeta potential, ion strength, Dybe length and electrode potential etc, and parameters of semiconductors properties, such as band gap, work function, type of semiconductor etc, are connected organically. The electron density and hole density in the mineral surface layer are depended on the values of surface potential barrier related to edge level; in addition, the dynamic process of semiconductor electrode is related to the change of surface potential barrier. All of them play an important role in the process of sulfide flotation.
引用
收藏
页码:93 / 96
页数:4
相关论文
共 28 条
  • [1] Prediction of edge energy level at mineral-solution interface by means of zeta potential
    陈建华
    冯其明
    卢毅屏
    欧乐明
    马运柱
    [J]. Transactions of Nonferrous Metals Society of China, 2000, (S1) : 93 - 96
  • [2] ATR-FTIR analysis of ligand adsorption at the mineral-solution interface
    Wanhala, Anna
    Stack, Andrew
    Cheshire, Michael
    Bryantsev, Vyacheslav
    [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2018, 255
  • [3] Control of silicate weathering by interface-coupled dissolution-precipitation processes at the mineral-solution interface
    Ruiz-Agudo, Encarnacion
    King, Helen E.
    Patino-Lopez, Luis D.
    Putnis, Christine V.
    Geisler, Thorsten
    Rodriguez-Navarro, Carlos
    Putnis, Andrew
    [J]. GEOLOGY, 2016, 44 (07) : 567 - 570
  • [4] MEASUREMENT OF ZETA-POTENTIAL AT AQUEOUS-SOLUTION SURFACE BY MEANS OF PLANE INTERFACE TECHNIQUE
    USUI, S
    IMAMURA, Y
    SASAKI, H
    [J]. JOURNAL OF COLLOID AND INTERFACE SCIENCE, 1987, 118 (02) : 335 - 342
  • [5] Phase transformation of calcium sulfate at mineral-solution interface: An overlooked pathway for selective enrichment of cadmium
    Li, Wenjing
    Che, Guiquan
    Wang, Chunli
    Zhang, Zhihao
    Zhang, Jing
    Lin, Zhang
    [J]. Journal of Hazardous Materials, 2025, 487
  • [6] ZETA-POTENTIAL MEASUREMENT BY MEANS OF THE PLANE INTERFACE TECHNIQUE
    SASAKI, H
    MURAMATSU, A
    ARAKATSU, H
    USUI, S
    [J]. JOURNAL OF COLLOID AND INTERFACE SCIENCE, 1991, 142 (01) : 266 - 271
  • [7] ZETA-POTENTIAL MEASUREMENT OF MUSCOVITE MICA BASAL-PLANE AQUEOUS-SOLUTION INTERFACE BY MEANS OF PLANE INTERFACE TECHNIQUE
    NISHIMURA, S
    TATEYAMA, H
    TSUNEMATSU, K
    JINNAI, K
    [J]. JOURNAL OF COLLOID AND INTERFACE SCIENCE, 1992, 152 (02) : 359 - 367
  • [8] Effect of molecular deposition filming displacement agent on the Zeta potential of reservoir mineral interface
    Liu, Hong-Sheng
    Gao, Mang-Lai
    [J]. Xi'an Shiyou Daxue Xuebao (Ziran Kexue Ban)/Journal of Xi'an Shiyou University, Natural Sciences Edition, 2006, 21 (05): : 42 - 45
  • [9] Zeta potential of stearic acid monolayer at the air-aqueous solution interface
    Usui, S
    Healy, TW
    [J]. JOURNAL OF COLLOID AND INTERFACE SCIENCE, 2002, 250 (02) : 371 - 378
  • [10] High temperature zeta potential measurements at the rutile/aqueous solution interface.
    Zhou, XY
    Wesolowski, D
    Machesky, M
    [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2002, 223 : U610 - U610