Polarization-modulated infrared reflection difference microspectroscopy: Experiment and model

被引：5

作者：

Schmidt, M. ^{[2
]}

Lee, J. S. ^{[1
]}

Schade, U. ^{[1
]}

机构：

[1] Helmholtz Zentrum Berlin Mat & Energie GmbH, Elektronenspeicherring BESSY 2, D-12489 Berlin, Germany

[2] Max Planck Inst Colloids & Interfaces, D-14424 Potsdam, Germany

来源：

INFRARED PHYSICS & TECHNOLOGY | 2010年 / 53卷 / 03期

关键词：

Infrared microspectroscopy; Polarization modulation; Synchrotron radiation; LINEAR DICHROISM; MOLECULAR-ORIENTATION; FT-IR; FILMS; SPECTROSCOPY; RELAXATION; POLYMERS;

D O I：

10.1016/j.infrared.2009.10.010

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Polarization-modulated infrared reflection difference microspectroscopy is a sensitive tool to spatially and spectrally resolve optical anisotropy of micrometric crystalline domains. However, intrinsic artifacts are associated with polarization modulation experiments, in particular due to the wavenumber-dependent efficiency of the photoelastic modulator. Here an account addressing this problem in our experimental approach is given. Comparing data from measurements on Ca1.4Sr0.6RuO4 and Bi0.3Ca0.7MnO3+delta with model calculations, it is shown that a simple model, which is based on reports in the literature, can be used to describe the experimental results. (C) 2009 Elsevier B.V. All rights reserved.

引用

页码：157 / 161

页数：5

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