Wavelength-scanning calibration of detection efficiency of single photon detectors by direct comparison with a photodiode

被引：11

作者：

Lee, Hee Jung ^{[1
,2
]}

Park, Seongchong ^{[1
]}

Park, Hee Su ^{[1
]}

Hong, Kee Suk ^{[1
]}

Lee, Dong-Hoon ^{[1
]}

Kim, Heonoh ^{[2
]}

Cha, Myoungsik ^{[2
]}

Moon, Han Seb ^{[2
]}

机构：

[1] Korea Res Inst Stand & Sci, Daejeon 34113, South Korea

[2] Pusan Natl Univ, Busan 46241, South Korea

来源：

METROLOGIA | 2016年 / 53卷 / 02期

关键词：

single photon detector; detection efficiency; broadband luminescence from GaN diode laser; SPECTRAL RESPONSIVITY; LUMINESCENCE; AMPLIFIER;

D O I：

10.1088/0026-1394/53/2/908

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We present a practical calibration method of the detection efficiency (DE) of single photon detectors (SPDs) in a wide wavelength range from 480 nm to 840 nm. The setup consists of a GaN laser diode emitting a broadband luminescence, a tunable bandpass filter, a beam splitter, and a switched integrating amplifier which can measure the photocurrent down to the 100 fA level. The SPD under test with a fibre-coupled beam input is directly compared with a reference photodiode without using any calibrated attenuator. The relative standard uncertainty of the DE of the SPD is evaluated to be from 0.8% to 2.2% varying with wavelength (k = 1).

引用

页码：908 / 917

页数：10

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