Distance Metrology With Integrated Mode-Locked Ring Laser

被引:3
|
作者
Hei, Kefei [1 ]
Shi, Guang [2 ]
Hansel, Andreas [1 ]
Deng, Zhongwen [1 ,5 ]
Latkowski, Sylwester [3 ]
Van den Berg, Steven A. [4 ]
Bente, Erwin [3 ]
Bhattacharya, Nandini [1 ]
机构
[1] Delft Univ Technol, Opt Res Grp, NL-2628 CJ Delft, Netherlands
[2] Hangzhou Dianzi Univ, Sch Mech Engn, Hangzhou 310018, Zhejiang, Peoples R China
[3] Eindhoven Univ Technol, Inst Photon Integrat, NL-5612 AP Eindhoven, Netherlands
[4] Natl Metrol Inst VSL, NL-2629 JA Delft, Netherlands
[5] Xi An Jiao Tong Univ, State Key Lab Mfg Syst Engn, Xian 710054, Shaanxi, Peoples R China
来源
IEEE PHOTONICS JOURNAL | 2019年 / 11卷 / 06期
关键词
Metrology; mode-locked lasers and integrated optics; FREQUENCY-COMB; LONG;
D O I
10.1109/JPHOT.2019.2940068
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The measurement of distance plays an integral part in many aspects of modern societies. In this paper an integrated mode-locked laser on a chip is used for distance measurement based on mode-resolved interferometry. The emission from the on-chip source with a repetition rate of 2.5 GHz and a spectral bandwidth of 3 nm is coupled into a Michelson interferometer. The interferometer output is recorded as a spectral interferogram, which is captured in a single camera image. The images are analyzed using Hilbert transform to extract the distance. The distance derived shows a deviation of 6 mu m from the reference, for a distance up to 25 mm. We also demonstrate interferometry with repetition frequency sweep which can also be used with the source. Performance is expected to be better in the near future with the rapid developments in the field of on-chip laser sources which are demonstrating larger spectral widths and coherence lengths.
引用
收藏
页数:10
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