Artificial neural network applied to eddy current nondestructive quantitative testing

被引：0
|
作者：
Sun, XY [1 ]
Liu, DH [1 ]
Wang, SH [1 ]
Sun, HQ [1 ]
Sheng, JN [1 ]
机构：
[1] Hebei Sci & Technol Univ, Shijiazhuang, Peoples R China
来源：
APPLIED ELECTROMAGNETICS (III) | 2001年 / 10卷
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Artificial neural network (ANN) is applied to eddy current nondestructive testing (ECNT) for detecting defects. After establishing the correlation between the amplitude or phase with the defect size, phase value was found to correlate better with the depth of defect. Wavelet edge detecting method can be used finding free edges. The results were used as inputs to ANN for analysis.
引用
收藏
页码：321 / 324
页数：4
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