Breakdown craters in thin insulating films studied by electron and atomic force microscopy.

被引：0
|
作者：
Thurstans, RE [1 ]
Harris, PJ [1 ]
机构：
[1] De Montfort Univ, Dept Chem & Phys, Leicester LE1 9BH, Leics, England
来源：
ELECTRON MICROSCOPY AND ANALYSIS 1997 | 1997年 / 153期
关键词：
D O I：
暂无
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
A wide variety of insulating materials are known to exhibit a so called 'formed state' after voltage applications in vacuum. This state is characterised by a region of differential negative resistance and electron emission at low bias. Breakdown craters, which are produced in the forming process, have been studied by electron and atomic force microscopy. The results indicate localised regions of high temperature, causing defects from which the observed properties may arise.
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页码：621 / 624
页数：4
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