Advanced cover glass defect detection and classification based on multi-DNN model

被引:12
|
作者
Park, Jisu [1 ]
Riaz, Hamza [2 ]
Kim, Hyunchul [3 ]
Kim, Jungsuk [1 ]
机构
[1] Gachon Univ, Dept Biomed Engn, 191 Hambakmoe Ro, Incheon 406799, South Korea
[2] GAIHST, Dept Hlth Sci & Technol, Incheon 21999, South Korea
[3] Univ Calif Berkeley, Sch Informat, 102 South Hall 4600, Berkeley, CA 94720 USA
基金
新加坡国家研究基金会;
关键词
Deep learning; Defect detection; Smart factory display manufacturing; SYSTEM;
D O I
10.1016/j.mfglet.2019.12.006
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Demands for display panels and relevant technologies are rapidly increasing with the recent advances in smart mobile devices. Many manufacturers have begun slowly investing in fully automated inspection systems that enable consistent and objective inspections. Carrying out such undertaking aims to satisfy high user requirements concerning quality while coping with high volumes. Cover glass is one of the important items for inspection because users directly interact with it. Despite the extensive use of typical machine vision-based solutions in this field, many manufacturers continue relying on human-based judgment because of a deficient understanding of defects or poor confidence in algorithms. To overcome these problems, this study proposes a deep-learning neural network (DLNN)-based defect inspection system. The DLNN has advantages over traditional computer vision- or human-based inspection in terms of flexibility and performance. We introduce a weighted multi-DLNN inspection system capable of efficiently utilizing multi-channel measurement data, with a detection rate of up to 99% and a false pass rate below 1%. (C) 2019 Society of Manufacturing Engineers (SME). Published by Elsevier Ltd. All rights reserved.
引用
收藏
页码:53 / 61
页数:9
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