Novel Chipless RFID High Resolution Crack Sensor Based on SWB Technology

被引：10
|
作者：
Dey, Shuvashis [1 ,2 ]
Kalansuriya, Prasanna [1 ,2 ]
Karmakar, Nemai Chandra [2 ]
机构：
[1] MIT, AutoID Labs, 77 Massachusetts Ave, Cambridge, MA 02139 USA
[2] Monash Univ, Dept Elect & Comp Syst Engn, Clayton, Vic 3800, Australia
来源：
IEEE SENSORS JOURNAL | 2021年 / 21卷 / 03期
基金：
澳大利亚研究理事会;
关键词：
Chipless RFID; super wide band; crack; structural health monitoring; time domain reflectometry; TAG;
D O I：
10.1109/JSEN.2020.3028296
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A novel chipless RFID based structural health monitoring sensor is proposed in this paper. By using the time domain reflectometry (TDR) based technique, this device enables a wireless, low-cost and pervasive sensing system for detecting the presence of crack in a structure. The proposed sensor is designed on the Taconic TLX-0 substrate and it integrates a super wide band (SWB) antenna with a long transmission line. The SWB antenna covers a bandwidth of 2-20 GHz which offers extremely short time domain pulses. This eventually enables a high-resolution crack sensing scheme that results in higher accuracy and greater precision. A thorough analysis on the designed sensors with a straight and a meandered transmission line is carried out and a comparative study between the SWB and UWB technologies is performed to imply the superiority of the proposed technique. The experimental results from a fabricated prototype of the sensor validate the theoretical analysis.
引用
收藏
页码：2908 / 2920
页数：13
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