Diagnostic Discrepancies in Mandatory Slide Review of Extradepartmental Head and Neck Cases Experience at a Large Academic Center
被引:17
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作者:
Mehrad, Mitra
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机构:
Washington Univ, Sch Med, Dept Pathol & Immunol, St Louis, MO USAWashington Univ, Sch Med, Dept Pathol & Immunol, St Louis, MO USA
Mehrad, Mitra
[1
]
Chernock, Rebecca D.
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机构:
Washington Univ, Sch Med, Dept Pathol & Immunol, St Louis, MO USA
Washington Univ, Sch Med, Dept Otolaryngol Head & Neck Surg, St Louis, MO 63110 USAWashington Univ, Sch Med, Dept Pathol & Immunol, St Louis, MO USA
Chernock, Rebecca D.
[1
,2
]
El-Mofty, Samir K.
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机构:
Washington Univ, Sch Med, Dept Pathol & Immunol, St Louis, MO USA
Washington Univ, Sch Med, Dept Otolaryngol Head & Neck Surg, St Louis, MO 63110 USAWashington Univ, Sch Med, Dept Pathol & Immunol, St Louis, MO USA
El-Mofty, Samir K.
[1
,2
]
Lewis, James S., Jr.
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机构:
Washington Univ, Sch Med, Dept Pathol & Immunol, St Louis, MO USA
Washington Univ, Sch Med, Dept Otolaryngol Head & Neck Surg, St Louis, MO 63110 USAWashington Univ, Sch Med, Dept Pathol & Immunol, St Louis, MO USA
Lewis, James S., Jr.
[1
,2
]
机构:
[1] Washington Univ, Sch Med, Dept Pathol & Immunol, St Louis, MO USA
[2] Washington Univ, Sch Med, Dept Otolaryngol Head & Neck Surg, St Louis, MO 63110 USA
Context.-Medical error is a significant problem in the United States, and pathologic diagnoses are a significant source of errors. Prior studies have shown that second-opinion pathology review results in clinically major diagnosis changes in approximately 0.6% to 5.8% of patients. The few studies specifically on head and neck pathology have suggested rates of changed diagnoses that are even higher. Objectives.-To evaluate the diagnostic discrepancy rates in patients referred to our institution, where all such cases are reviewed by a head and neck subspecialty service, and to identify specific areas with more susceptibility to errors. Design.-Five hundred consecutive, scanned head and neck pathology reports from patients referred to our institution were compared for discrepancies between the outside and in-house diagnoses. Major discrepancies were defined as those resulting in a significant change in patient clinical management and/or prognosis. Results.-Major discrepancies occurred in 20 cases (4% overall). Informative follow-up material was available on 11 of the 20 patients (55.0%), among whom, the second opinion was supported in 11 of 11 cases (100%). Dysplasia versus invasive squamous cell carcinoma was the most common (7 of 20; 35%) area of discrepancy, and by anatomic subsite, the sinonasal tract (4 of 21; 19.0%) had the highest rate of discrepant diagnoses. Of the major discrepant diagnoses, 12 (12 of 20; 60%) involved a change from benign to malignant, one a change from malignant to benign (1 of 20; 5%), and 6 involved tumor classification (6 of 20; 30%). Conclusions.-Head and neck pathology is a relatively high-risk area, prone to erroneous diagnoses in a small fraction of patients. This study supports the importance of second-opinion review by subspecialized pathologists for the best care of patients.
机构:
Univ Miami, Miller Sch Med, Jackson Mem Hlth Syst, Dept Pathol, Miami, FL 33136 USAUniv Miami, Miller Sch Med, Jackson Mem Hlth Syst, Dept Pathol, Miami, FL 33136 USA
Gutierrez Alonso, D.
Guido, L. Paulo De Lima
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Univ Miami, Miller Sch Med, Jackson Mem Hlth Syst, Dept Pathol, Miami, FL 33136 USAUniv Miami, Miller Sch Med, Jackson Mem Hlth Syst, Dept Pathol, Miami, FL 33136 USA
Guido, L. Paulo De Lima
Langlie, J. A.
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机构:
Univ Miami Hosp & Clin, Dept Pathol, Sylvester Comprehens Canc Ctr, Miami, FL USAUniv Miami, Miller Sch Med, Jackson Mem Hlth Syst, Dept Pathol, Miami, FL 33136 USA
Langlie, J. A.
Velez-Torres, J.
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Univ Miami Hosp & Clin, Dept Pathol, Sylvester Comprehens Canc Ctr, Miami, FL USAUniv Miami, Miller Sch Med, Jackson Mem Hlth Syst, Dept Pathol, Miami, FL 33136 USA
Velez-Torres, J.
Garcia-Buitrago, M. T.
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Univ Miami Hosp & Clin, Dept Pathol, Sylvester Comprehens Canc Ctr, Miami, FL USAUniv Miami, Miller Sch Med, Jackson Mem Hlth Syst, Dept Pathol, Miami, FL 33136 USA
Garcia-Buitrago, M. T.
Gomez-Fernandez, C.
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Univ Miami Hosp & Clin, Dept Pathol, Sylvester Comprehens Canc Ctr, Miami, FL USAUniv Miami, Miller Sch Med, Jackson Mem Hlth Syst, Dept Pathol, Miami, FL 33136 USA
机构:
Mem Sloan Kettering, Dept Pathol, New York, NY 10065 USAMem Sloan Kettering, Dept Pathol, New York, NY 10065 USA
Hanna, Matthew G.
Reuter, Victor E.
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机构:
Mem Sloan Kettering, Dept Pathol, New York, NY 10065 USA
Warren Alpert Ctr Digital & Computat Pathol, New York, NY 10065 USAMem Sloan Kettering, Dept Pathol, New York, NY 10065 USA
Reuter, Victor E.
Hameed, Meera R.
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机构:
Mem Sloan Kettering, Dept Pathol, New York, NY 10065 USA
Warren Alpert Ctr Digital & Computat Pathol, New York, NY 10065 USAMem Sloan Kettering, Dept Pathol, New York, NY 10065 USA
Hameed, Meera R.
Tan, Lee K.
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Mem Sloan Kettering, Dept Pathol, New York, NY 10065 USAMem Sloan Kettering, Dept Pathol, New York, NY 10065 USA
Tan, Lee K.
Chiang, Sarah
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Mem Sloan Kettering, Dept Pathol, New York, NY 10065 USAMem Sloan Kettering, Dept Pathol, New York, NY 10065 USA
Chiang, Sarah
Sigel, Carlie
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Mem Sloan Kettering, Dept Pathol, New York, NY 10065 USAMem Sloan Kettering, Dept Pathol, New York, NY 10065 USA
Sigel, Carlie
Hollmann, Travis
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Mem Sloan Kettering, Dept Pathol, New York, NY 10065 USAMem Sloan Kettering, Dept Pathol, New York, NY 10065 USA
Hollmann, Travis
Giri, Dilip
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Mem Sloan Kettering, Dept Pathol, New York, NY 10065 USAMem Sloan Kettering, Dept Pathol, New York, NY 10065 USA
Giri, Dilip
Samboy, Jennifer
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Mem Sloan Kettering, Dept Pathol, New York, NY 10065 USA
Warren Alpert Ctr Digital & Computat Pathol, New York, NY 10065 USAMem Sloan Kettering, Dept Pathol, New York, NY 10065 USA
Samboy, Jennifer
Moradel, Carlos
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Mem Sloan Kettering, Dept Pathol, New York, NY 10065 USAMem Sloan Kettering, Dept Pathol, New York, NY 10065 USA
Moradel, Carlos
Rosado, Andrea
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Mem Sloan Kettering, Dept Pathol, New York, NY 10065 USAMem Sloan Kettering, Dept Pathol, New York, NY 10065 USA
Rosado, Andrea
Otilano, John R., III
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Mem Sloan Kettering, Dept Pathol, New York, NY 10065 USAMem Sloan Kettering, Dept Pathol, New York, NY 10065 USA
Otilano, John R., III
England, Christine
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Mem Sloan Kettering, Dept Pathol, New York, NY 10065 USAMem Sloan Kettering, Dept Pathol, New York, NY 10065 USA
England, Christine
Corsale, Lorraine
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Mem Sloan Kettering, Dept Pathol, New York, NY 10065 USAMem Sloan Kettering, Dept Pathol, New York, NY 10065 USA
Corsale, Lorraine
Stamelos, Evangelos
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Mem Sloan Kettering, Dept Pathol, New York, NY 10065 USAMem Sloan Kettering, Dept Pathol, New York, NY 10065 USA
Stamelos, Evangelos
Yagi, Yukako
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机构:
Mem Sloan Kettering, Dept Pathol, New York, NY 10065 USA
Warren Alpert Ctr Digital & Computat Pathol, New York, NY 10065 USAMem Sloan Kettering, Dept Pathol, New York, NY 10065 USA
Yagi, Yukako
Schuffler, Peter J.
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Mem Sloan Kettering, Dept Pathol, New York, NY 10065 USA
Warren Alpert Ctr Digital & Computat Pathol, New York, NY 10065 USAMem Sloan Kettering, Dept Pathol, New York, NY 10065 USA
Schuffler, Peter J.
Fuchs, Thomas
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Mem Sloan Kettering, Dept Pathol, New York, NY 10065 USA
Warren Alpert Ctr Digital & Computat Pathol, New York, NY 10065 USAMem Sloan Kettering, Dept Pathol, New York, NY 10065 USA
Fuchs, Thomas
Klimstra, David S.
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Mem Sloan Kettering, Dept Pathol, New York, NY 10065 USA
Warren Alpert Ctr Digital & Computat Pathol, New York, NY 10065 USAMem Sloan Kettering, Dept Pathol, New York, NY 10065 USA
Klimstra, David S.
Sirintrapun, S. Joseph
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机构:
Mem Sloan Kettering, Dept Pathol, New York, NY 10065 USA
Warren Alpert Ctr Digital & Computat Pathol, New York, NY 10065 USAMem Sloan Kettering, Dept Pathol, New York, NY 10065 USA