Characteristics of total reflection at interface between left-handed and right-handed materials

被引：3

作者：

Shi Gang ^{[1
]}

Cen Be-Ping ^{[1
]}

Fan Li ^{[1
]}

Liu Yong-Jun ^{[1
]}

机构：

[1] Yangzhou Univ, Coll Phys Sci & Technol, Yangzhou 225000, Peoples R China

来源：

ACTA PHYSICA SINICA | 2007年 / 56卷 / 08期

关键词：

left-handed materials; negative index of refraction; total reflection; evanescent waves;

D O I：

10.7498/aps.56.4653

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Characteristics of total reflection at the interface between left-handed and right-handed materials are derived from electromagnetic theory, and the phase is researched. The experimental idea of observing interference fringes of evanescent waves, when total reflection takes place at the interface is discussed, and the distribution of interference fringes is calculated from electromagnetic theory.

引用

页码：4653 / 4656

页数：4

共 8 条

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