Optocouplers: Fundamentals and Hardness Assurance for Space Applications

被引：9
|
作者：
Johnston, A. H. [1 ]
Harris, R. D. [1 ]
Miyahira, T. F. [1 ]
机构：
[1] CALTECH, Jet Prop Lab, Pasadena, CA 91125 USA
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2009年 / 56卷 / 06期
关键词：
Displacement damage; hardness assurance; optocoupler; proton damage; space radiation effects; PROTON DAMAGE; ENERGY-DEPENDENCE; DEGRADATION;
D O I：
10.1109/TNS.2009.2033685
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Operating principles and hardness assurance methods are discussed for various types of optocouplers. Radiation damage in light-emitting diodes is addressed, along with the impact of phototransistors and internal amplifiers on overall performance. Hardness assurance for optocouplers is contrasted with the approach used for conventional microelectronics. Methods of detecting abnormal devices are discussed, along with the implementation of special screening measurements.
引用
收藏
页码：3310 / 3317
页数：8
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