Bistatic electromagnetic scattering from randomly rough surfaces

被引:0
|
作者
Du, Y. [1 ]
Chen, H. Y. [1 ]
Qi, Y. [1 ]
Kong, J. A. [2 ]
机构
[1] Zhejiang Univ, Hangzhou 310058, Peoples R China
[2] MIT, Cambridge, MA 02139 USA
基金
美国国家科学基金会;
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper we propose a bistatic model for electromagnetic scattering from a Gaussian rough surface with small to moderate heights. It is based on the integral equation formulation where the spectral representations of the Green's function and its gradient are in complete forms, a general approach similar to those used in the advanced integral equation model (AIEM) and the integral equation model for second-order multiple scattering (IEM2M). Yet this new model can be regarded as an extension to these two models on two accounts: first it has made fewer and less restrictive assumptions in evaluating the complementary scattering coefficient for single scattering, and second it contains a more rigorous analysis by the inclusion of the error function related terms for the cross and complementary scattering coefficients, which stems from the absolute phase term in the spectral representation of the Green's function. It is expected that our result for complementary scattering coefficient is more accurate and more general, even when the effect of the error function related terms is neglected. As a result, the proposed model is expected to have wider applicability with a better accuracy. The validity of this extended bistatic scattering model is demonstrated through the excellent agreements between model predictions and measurement data.
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页码:243 / +
页数:2
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