Outage Probability of Two-Way Relaying Systems Over Mixed Fluctuating Two-Ray and Nakagami-m Fading Channels

被引:0
|
作者
Zhang, Jiayi [1 ]
Zhang, Yongshun [1 ]
Ai, Bo [2 ]
机构
[1] Beijing Jiaotong Univ, Sch Elect & Informat Engn, Beijing 100044, Peoples R China
[2] Beijing Jiaotong Univ, State Key Lab Rail Traff Control & Safety, Beijing 100044, Peoples R China
关键词
D O I
10.23919/ursigass49373.2020.9232201
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Two-way relaying systems can significantly save time resource and increase the throughput for wireless communication systems. In this paper, we carry out the performance analysis of two-way relaying systems over mixed fluctuating two-ray (FTR) and Nakagami-m fading channels. The FTR fading promises a good fit for small-scale experimental data in millimeter wave communications. More specifically, we derive novel and exact analytical expressions for outage probability (OP) and simple asymptotic OP at high signal-to-noise-ratio regimes to show important physical insights into the impact of parameters on the system performance. It is interesting to find that lager values of fading severity parameters of both links help to decrease the OP. Finally, the correctness of our derived analytical results is validated by Monte Carlo simulations.
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页数:4
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