A new single-crystal mounting technique for low-background high-temperature X-ray diffraction

被引：4
|
作者：
Schreuer, J [1 ]
Baumgarte, A [1 ]
Steurer, W [1 ]
机构：
[1] ETH Zentrum, Lab Cristallog, CH-8092 Zurich, Switzerland
来源：
JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1997年 / 30卷
关键词：
D O I：
10.1107/S0021889897003142
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
A new single-crystal mounting technique for high-temperature X-ray diffraction up to 1700 K on an imaging plate scanner has been developed. The crystal is clamped mechanically by three to six very thin alumina fibres. Besides the cheap and easy manufacturing procedure, its major advantage is the resultant very low background; it consists mainly of weak, smooth Debye-Scherrer rings which can be easily removed by image-processing methods.
引用
收藏
页码：1162 / 1164
页数：3
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