EFFECTS OF GROUP III DOPANTS ON THE STRUCTURAL AND OPTICAL PROPERTIES OF SOL-GEL DERIVED ZnO THIN FILMS

被引:0
|
作者
Santibenchakul, Somtop [1 ]
Noonuruk, Russameeruk [2 ]
Ruangon, Kamonchanok [3 ]
Khamon, Warut [3 ]
Pecharapa, Wisanu [3 ]
机构
[1] Rajamangala Univ Technol Tawan Ok, Fac Sci & Technol, Dept Sci & Math, Chon Buri 20110, Thailand
[2] Rajamangala Univ Technol Thanyaburi, Fac Sci & Technol, Div Phys, Pathum Thani 12110, Thailand
[3] King Alongkuts Inst Technol Ladkrabang, Coll Nanotechnol, Bangkok 10520, Thailand
来源
关键词
Group III dopants; sol-gel; ZnO thin films; ELECTRICAL-PROPERTIES; AL; GA; DEPOSITION;
D O I
暂无
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
In this research, the effect of group III dopants on the structural and optical properties of zinc oxide (ZnO) thin films was investigated. Undoped, Al-, Ga-, and In- doped ZnO thin films at a constant 3 at. % doping content were fabricated by the simple route of a sol- gel spin coating process followed by an annealing technique in an ambient pressure at 500 degrees C. Zinc acetate dihydrate ( Zn(CH3COO)(2)center dot 2H(2)O), aluminum nitrate nonahydrate (Al(NO3)(3)center dot 9H(2)O), gallium (III) nitrate hydrate (Ga(NO3)(3)center dot xH(2)O), and indium (III) acetate (In(CH3COO)(3)) were used as the starting materials for Zn, Al, Ga, and In sources, respectively. The structural properties of undoped and group III- doped ZnO thin films agreed with the hexagonal wurtzite crystal structure. Moreover, incorporation of group III dopants into the ZnO lattice was able to decrease the grain size and deteriorate the crystallinity of the ZnO. The transmittance phenomena in the visible region of all thin films was shown to be higher than 92%. Furthermore, the optical band gap of ZnO doping with group III dopants is higher than for purified ZnO. In the same way, the morphology of ZnO has a sharp distinction with various types of group III dopants.
引用
收藏
页码:44 / 50
页数:7
相关论文
共 50 条
  • [1] Effect of dopants on the structural, optical and electrical properties of sol-gel derived ZnO semiconductor thin films
    Tsay, Chien-Yie
    Lee, Wen-Che
    [J]. CURRENT APPLIED PHYSICS, 2013, 13 (01) : 60 - 65
  • [2] Effects of withdrawal speed on the structural and optical properties of sol-gel derived ZnO thin films
    Aydemir, Sinem
    Karakaya, Seniye
    [J]. JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2015, 373 : 33 - 39
  • [3] Dependence of structural and optical properties of sol-gel derived ZnO thin films on sol concentration
    Xu, Linhua
    Zheng, Gaige
    Miao, Juhong
    Xian, Fenglin
    [J]. APPLIED SURFACE SCIENCE, 2012, 258 (19) : 7760 - 7765
  • [4] Electrical and optical properties of sol-gel derived ZnO:Al thin films
    Sagar, P
    Kumar, M
    Mehra, RM
    [J]. MATERIALS SCIENCE-POLAND, 2005, 23 (03): : 685 - 696
  • [5] Electrical and optical properties of sol-gel derived ZnO: Al thin films
    Sagar, P.
    Kumar, M.
    Mehra, R.M.
    [J]. Materials Science, 2005, 23 (03): : 685 - 696
  • [6] Effects of Mg additions on microstructure and optical properties of sol-gel derived ZnO thin films
    Tsay, Chien-Yie
    Wang, Min-Chi
    Chiang, Shin-Chuan
    [J]. MATERIALS TRANSACTIONS, 2008, 49 (05) : 1186 - 1191
  • [7] Structural and optical properties of copper doped ZnO films derived by sol-gel
    Caglar, M.
    Yakuphanoglu, F.
    [J]. APPLIED SURFACE SCIENCE, 2012, 258 (07) : 3039 - 3044
  • [8] Structural and optical properties of ZnO thin films prepared by sol-gel method
    Khanlary, M. R.
    Isazadeh, S.
    [J]. MICRO & NANO LETTERS, 2011, 6 (09): : 767 - 769
  • [9] Optical and Structural Properties of Sol - Gel Derived ZnO:F Thin Films
    Ivanova, T.
    Harizanova, A.
    Koutzarova, T.
    Vertruyen, B.
    [J]. 10TH JUBILEE CONFERENCE OF THE BALKAN PHYSICAL UNION, 2019, 2075
  • [10] Post annealing effect on structural and optical properties of ZnO thin films derived by sol-gel route
    Singh, Amanpal
    Kumar, Dinesh
    Khanna, P. K.
    Kumar, Mukesh
    Prasad, B.
    [J]. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2013, 24 (11) : 4607 - 4613