An important role of electron microscopy in development of nano science and technology

被引：0
|
作者：
Ze, Z [1 ]
机构：
[1] Chinese Acad Sci, Inst Phys, Beijing 100080, Peoples R China
来源：
RARE METAL MATERIALS AND ENGINEERING | 2000年 / 29卷
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中图分类号：
T [工业技术];
学科分类号：
08 ;
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页码：6 / 6
页数：1
相关论文
共 6 条
  • [1] CHENG LS, 1999, APPL PHYS LETT, P74
  • [2] Microstructure of columnar crystallites in Ni80Fe20/Cu magnetic multilayers
    Sun, HP
    Zhang, Z
    Wang, WD
    Jiang, HW
    Lai, WY
    [J]. JOURNAL OF APPLIED PHYSICS, 2000, 87 (06) : 2835 - 2839
  • [3] SUN HP, 2000, IN PRESS APPL PHYS L
  • [4] WANG RP, 2000, PHYS REV B, P61
  • [5] Controlled Li doping of Si nanowires by electrochemical insertion method
    Zhou, GW
    Li, H
    Sun, HP
    Yu, DP
    Wang, YQ
    Huang, XJ
    Chen, LQ
    Zhang, Z
    [J]. APPLIED PHYSICS LETTERS, 1999, 75 (16) : 2447 - 2449
  • [6] Transmission electron microscopy study of Si nanowires
    Zhou, GW
    Zhang, Z
    Bai, ZG
    Feng, SQ
    Yu, DP
    [J]. APPLIED PHYSICS LETTERS, 1998, 73 (05) : 677 - 679
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