Experimental results for a CW-mode optically controlled microwave switch on a silicon-based coplanar waveguide

A CW-mode optically controlled microwave sit itch (CW-mode OMS) on a coplanar waveguide (CPW) for both a standard and a new design with carrier-confinement structure is investigated. We experimentally show that it may, not be possible to obtain less than 7 dB of insertion loss with the standard OMS, and the carrier diffusion limits the improvement of insertion loss in CW-mode operation. We present a new design with a carrier-confinement structure with silicon (Si) substrate etching to confine the optically generated free-carriers. Less than 2 dB of insertion loss is obtained with the new carrier-confined OMS. (C) 2003 Wile Periodicals, Inc.