Impact of N2O admixture on the characteristics of pulsed dielectric barrier discharges in N2 at atmospheric pressure

被引:3
|
作者
Hoeft, H. [1 ]
Kettlitz, M. [1 ]
Becker, M. M. [1 ]
Brandenburg, R. [1 ]
机构
[1] Leibniz Inst Plasma Sci & Technol INP Greifswald, Felix Hausdorff Str 2, D-17489 Greifswald, Germany
关键词
dielectric barrier discharge; nitrous oxide; electrical and optical diagnostics; 0D modelling; electron attachment/detachment; pre-ionisation; CHEMICAL-VAPOR-DEPOSITION; DIAGNOSTICS; FILAMENTARY; CHEMISTRY; MIXTURES; PHYSICS; AIR;
D O I
10.1088/1361-6463/ab4944
中图分类号
O59 [应用物理学];
学科分类号
摘要
The impact of N2O admixtures on the inception and development of pulsed dielectric barrier discharges (DBDs) in N-2 at atmospheric pressure is studied using optical and electrical diagnostics supported by 0D modelling of the reaction kinetics. The N2O concentration in the N-2-N2O gas mixture was varied between virtually pure N-2 and 10 vol% N2O. A significant impact of N2O on the discharge characteristics was found for concentrations above 1000 ppm. In particular, a decrease of the transferred charge, and discharge energy and an increase of breakdown voltage, maximal discharge current, discharge emission diameter and velocity of the cathode-directed ionisation front (positive streamer) were observed. Additionally, a strong increase of breakdown voltage and discharge inception jitter accompanied by a decrease of the emission duration was found for N2O concentrations above 1 vol%. The modelling results indicate that for N2O concentrations in this range a transition from an electropositive to an electronegative regime takes place.
引用
收藏
页数:13
相关论文
共 50 条
  • [1] Characteristics of N2 and N2/O2 atmospheric pressure glow discharges
    Klas, Matej
    Ptasinska, Sylwia
    [J]. PLASMA SOURCES SCIENCE & TECHNOLOGY, 2013, 22 (02):
  • [2] Comparison of sinusoidal and pulsed-operated dielectric barrier discharges in an O2/N2 mixture at atmospheric pressure
    Kettlitz, M.
    Hoeft, H.
    Hoder, T.
    Weltmann, K-D
    Brandenburg, R.
    [J]. PLASMA SOURCES SCIENCE & TECHNOLOGY, 2013, 22 (02):
  • [3] Study on the characteristics of atmospheric dielectric barrier discharges in He-N2 admixture
    [J]. Song, X., 1600, Institute of Electrical and Electronics Engineers Inc., United States (40):
  • [4] Study on the Characteristics of Atmospheric Dielectric Barrier Discharges in He-N2 Admixture
    Song, Xinxin
    Tan, Zhenyu
    Chen, Bo
    [J]. IEEE TRANSACTIONS ON PLASMA SCIENCE, 2012, 40 (12) : 3471 - 3475
  • [5] Exploring the mechanisms leading to diffuse and filamentary modes in dielectric barrier discharges in N2 with N2O admixtures
    Hoeft, Hans
    Becker, Markus M.
    Kettlitz, Manfred
    Dap, Simon
    Naude, Nicolas
    Brandenburg, Ronny
    Weltmann, Klaus-Dieter
    [J]. EUROPEAN PHYSICAL JOURNAL D, 2023, 77 (03):
  • [6] Characteristics of dielectric barrier discharges operating in air with flowing N2
    Hao, Y. P.
    Wang, X. L.
    [J]. 2007 ANNUAL REPORT CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA, 2007, : 788 - 791
  • [7] n-hexane soot oxidation reactivity in N2/O2 and N2/O2/NO2 atmospheric pressure pulsed corona discharges
    Aggadi, N.
    Duten, X.
    Marteau, Ph.
    Redolfi, M.
    Hassouni, K.
    [J]. EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS, 2006, 36 (02): : 165 - 175
  • [8] The Effect of O2 in a Humid O2/N2/NOx Gas Mixture on NOx and N2O Remediation by an Atmospheric Pressure Dielectric Barrier Discharge
    Teodoru, Steluta
    Kusano, Yukihiro
    Bogaerts, Annemie
    [J]. PLASMA PROCESSES AND POLYMERS, 2012, 9 (07) : 652 - 689
  • [9] Formation of NOx from N2 and O2 in catalyst-pellet filled dielectric barrier discharges at atmospheric pressure
    Sun, Q
    Zhu, AM
    Yang, XF
    Niu, JH
    Xu, Y
    [J]. CHEMICAL COMMUNICATIONS, 2003, (12) : 1418 - 1419
  • [10] Axial and radial development of microdischarges of barrier discharges in N2/O2 mixtures at atmospheric pressure
    Brandenburg, R
    Wagner, HE
    Morozov, AM
    Koziov, KV
    [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2005, 38 (11) : 1649 - 1657