Crystalline organic molecular thin film with electrical switching property: Scanning probe microscopy and optical spectroscopy study

被引:12
|
作者
Li, JC
Xue, ZQ
Wang, KZ
Wang, ZM
Yan, CH
Song, YL
Jiang, L
Zhu, DB
机构
[1] Peking Univ, Dept Elect, Beijing 100871, Peoples R China
[2] Beijing Normal Univ, Dept Chem, Beijing 100875, Peoples R China
[3] Peking Univ, State Key Lab Rare Earth Mat Chem & Applicat, Beijing 100871, Peoples R China
[4] Chinese Acad Sci, Organ Solid Lab, Inst Chem, Beijing 100080, Peoples R China
来源
JOURNAL OF PHYSICAL CHEMISTRY B | 2004年 / 108卷 / 50期
关键词
D O I
10.1021/jp047733g
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We report on the growth and characterization of crystalline 1, 1 -dicyano-2,2-(4-dimethylaminophenyl)ethylene (DDME) thin film with electrical switching property. X-ray diffraction analysis indicates that bulk singlecrystal DDME belongs to monoclinic, space group P2(1), and Z = 2 structure. Optical spectroscopy shows that the film chemical structure is consistent with that of the powder material, suggesting that DDME material is very stable during the vacuum thermal deposition process. Scanning probe microscopy and transmission electron microscopy observations reveal that the as-deposited film has extended crystal structure and smooth surface morphology in micrometer scale. Parallel molecular stacking structure is repeatedly observed in the film surfaces with the axis of the molecular stack parallel to the substrate. The ac crystal plane is found to be one of the most stable surfaces of the DDME film in ambient conditions. Nanometer scale data storage is realized on the film by applying pulse voltage between the STM tip and the substrate. The switching mechanism is briefly discussed.
引用
收藏
页码:19348 / 19353
页数:6
相关论文
共 50 条
  • [1] Electrical Characteristics of Organic Molecular Wires by Scanning Probe Microscopy
    Lee, N. J.
    Kim, S. B.
    Koo, S. H.
    Choi, Y. J.
    Kim, J. W.
    Kim, Y. S.
    Kang, C. J.
    2008 2ND IEEE INTERNATIONAL NANOELECTRONICS CONFERENCE, VOLS 1-3, 2008, : 443 - +
  • [3] Femtosecond optical spectroscopy and scanning probe microscopy
    Feldstein, MJ
    Vohringer, P
    Wang, W
    Scherer, NF
    JOURNAL OF PHYSICAL CHEMISTRY, 1996, 100 (12): : 4739 - 4748
  • [4] Scanning Kelvin Probe Microscopy study on Oxide Thin Film Transistor
    Park, J. -H.
    Cha, H. -G.
    THIN FILM TRANSISTORS 11 (TFT 11), 2012, 50 (08): : 209 - 213
  • [5] The potential of the scanning probe microscopy for thin film characterization
    Oesterschulze, E
    SURFACE & COATINGS TECHNOLOGY, 1997, 97 (1-3): : 694 - 706
  • [6] Scanning probe microscopy based electrical characterization of thin dielectric and organic semiconductor films
    Hofer, Alexander
    Biberger, Roland
    Benstetter, Guenther
    Wilke, Bjoern
    Goebel, Holger
    MICROELECTRONICS RELIABILITY, 2013, 53 (9-11) : 1430 - 1433
  • [7] Scanning near-field optical microscopy/spectroscopy of thin organic films
    Nagahara, LA
    Tokumoto, H
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (02): : 800 - 803
  • [8] Scanning probe microscopy of organic semiconductor thin films
    Izquierdo, Nezhueyotl
    Frisbie, C. Dan
    Wu, Yanfei
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2013, 245
  • [9] Electrical Scanning Probe Microscopy on Active Organic Electronic Devices
    Pingree, Liam S. C.
    Reid, Obadiah G.
    Ginger, David S.
    ADVANCED MATERIALS, 2009, 21 (01) : 19 - 28
  • [10] Application of scanning near-field optical microscopy to thin organic film devices
    Fujihira, M
    Monobe, H
    Koike, A
    Ivanov, GR
    Muramatsu, H
    Chiba, N
    Yamamoto, N
    Ataka, T
    ULTRAMICROSCOPY, 1998, 71 (1-4) : 269 - 274