Industrial Plume Properties Retrieved by Optimal Estimation Using Combined Hyperspectral and Sentinel-2 Data

Stack emissions from the industrial sector are a subject of concern for air quality. However, the characterization of the stack emission plume properties from in situ observations remains a challenging task. This paper focuses on the characterization of the aerosol properties of a steel plant stack plume through the use of hyperspectral (HS) airborne remote sensing imagery. We propose a new method, based on the combination of HS airborne acquisition and surface reflectance imagery derived from the Sentinel-2 Multi-Spectral Instrument (MSI). The proposed method detects the plume footprint and estimates the surface reflectance under the plume, the aerosol optical thickness (AOT), and the modal radius of the plume. Hyperspectral surface reflectances are estimated using the coupled non-negative matrix factorization (CNMF) method combining HS and MSI data. The CNMF reduces the error associated with estimating the surface reflectance below the plume, particularly for heterogeneous classes. The AOT and modal radius are retrieved using an optimal estimation method (OEM), based on the forward model and allowing for uncertainties in the observations and in the model parameters. The a priori state vector is provided by a sequential method using the root mean square error (RMSE) metric, which outperforms the previously used cluster tuned matched filter (CTMF). The OEM degrees of freedom are then analysed, in order to refine the mask plume and to enhance the quality of the retrieval. The retrieved mean radii of aerosol particles in the plume is 0.125 mu m, with an uncertainty of 0.05 mu m. These results are close to the ultra-fine mode (modal radius around 0.1 mu m) observed from in situ measurements within metallurgical plant plumes from previous studies. The retrieved AOT values vary between 0.07 (near the source point) and 0.01, with uncertainties of 0.005 for the darkest surfaces and above 0.010 for the brightest surfaces.