Modeling X-ray Line Shapes from Asphaltenes

被引：2

作者：

Alqahtani, H. ^{[1
]}

Lewis, J. Courtenay ^{[1
]}

Shirokoff, J. ^{[2
]}

机构：

[1] Mem Univ Newfoundland, Dept Phys & Phys Oceanog, St John, NF A1B 3X7, Canada

[2] Mem Univ Newfoundland, Dept Proc Engn, St John, NF A1B 3X7, Canada

来源：

XXIII INTERNATIONAL CONFERENCE ON SPECTRAL LINE SHAPES | 2017年 / 810卷

关键词：

D O I：

10.1088/1742-6596/810/1/012049

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

Structural studies of asphaltene in crude oil have been performed by x-ray diffraction (XRD). The XRD spectra were taken with a Rigaku Dmax 2200V/PC, and builtin JadeTM software was used for initial analysis. XRD was performed with Cu-K-a radiation operating at 40 KV and 40 mA, with a scan rate of 0.001 degrees 2 theta per second. The XRD data were first fitted with Pearson VII profiles and then with pseudo-Voigt profiles, and then modeled in Mathematica(C) using a generalized Fermi function (GFF). These fits also included several different backgrounds (linear, exponential, and Lorentzian). The results are discussed in terms of their accuracy with different combinations of background and line profile.

引用

页数：4

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