Diffraction gratings as small-angle X-ray scattering calibration standards

被引：5

作者：

Nygard, K. ^{[1
]}

Bunk, O. ^{[1
]}

Perret, E. ^{[1
]}

David, C. ^{[1
]}

van der Veen, J. F. ^{[1
,2
]}

机构：

[1] Paul Scherrer Inst, Res Dept Synchrotron Radiat & Nanotechnol, CH-5232 Villigen, Switzerland

[2] ETH, CH-8093 Zurich, Switzerland

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2010年 / 43卷

关键词：

D O I：

10.1107/S002188981000467X

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

It is shown that diffraction gratings can be used as accurate momentum-transfer calibration standards in small-angle X-ray scattering experiments. For demonstration purposes, a silicon diffraction grating with a period of 400 nm is used. The data exhibit 50 diffraction peaks evenly distributed in the momentum-transfer range q = 0.0-0.8 nm(-1), a regime that is not accessible using the traditional silver behenate standard.

引用

页码：350 / 351

页数：2

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