Switching of Dipole Coupled Multiferroic Nanomagnets in the Presence of Thermal Noise: Reliability of Nanomagnetic Logic (vol 12, pg 1206, 2013)

被引：0

作者：

Fashami, Mohammad Salehi ^{[1
]}

Munira, Kamaram ^{[2
]}

Bandyopadhyay, Supriyo ^{[3
]}

Ghosh, Avik W. ^{[4
]}

Atulasimha, Jayasimha ^{[5
]}

机构：

[1] Univ Delaware, Dept Phys, Newark, DE 19716 USA

[2] Univ Alabama, Ctr Mat Informat Technol, Tuscaloosa, AL 35405 USA

[3] Virginia Commonwealth Univ, Dept Elect Engn, Richmond, VA 23284 USA

[4] Univ Virginia, Dept Elect & Comp Engn, Charlottesville, VA 22903 USA

[5] Virginia Commonwealth Univ, Dept Mech & Nucl Engn, Richmond, VA 23284 USA

来源：

关键词：

D O I：

10.1109/TNANO.2014.2365796

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：196 / 197

页数：2