A SEMISUPERVISED FEATURE METRIC BASED BAND SELECTION METHOD FOR HYPERSPECTRAL IMAGE CLASSIFICATION

被引:0
|
作者
Yang, Chen [1 ]
Liu, Sicong [2 ]
Bruzzone, Lorenzo [2 ]
Guan, Renchu [3 ]
Du, Peijun [4 ]
机构
[1] Jilin Univ, Coll Earth Sci, Changchun 130023, Peoples R China
[2] Univ Trento, Dept Informat Engn & Comp Sci, Trento, Italy
[3] Jilin Univ, Coll Comp Sci & Technol, Changchun, Peoples R China
[4] Nanjing Univ, Dept Geog Informat Sci, Nanjing, Peoples R China
基金
中国博士后科学基金; 中国国家自然科学基金;
关键词
Hyperspectral images; Band selection; Feature selection; Relevant component analysis; Affinity propagation; Feature metric;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents a novel semi-supervised band selection technique for classification of the hyperspectral image. In our proposed method, a simple and efficient metric learning algorithm, i.e. relevant component analysis, is adopted for learning the whitening transformation matrix from which a feature metric is constructed for feature selection. This metric assesses both the class discrimination capability of the single band and the spectral correlation between the any two bands. The affinity propagation technique is then employed as the clustering strategy to select an effective band subset from original spectral bands. Experimental results demonstrate that the proposed method can effectively select the representative bands and reduce the band redundancy for improving the classification accuracy. In addition, the comparison with some literature band selection methods also confirms the superiority of the proposed approach.
引用
收藏
页数:4
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