Study of testability design for complex electronic products

被引：0
|
作者：
Huang, Kao-li [1 ]
Lian, Guang-yao
Tian, Mian
Zheng, Xin-lia
机构：
[1] Ordnance Engn Coll, Dept Missile Engn, Shijiazhuang 050003, Peoples R China
[2] Sect PLA Representat 356 Factory, Kunming 650000, Peoples R China
[3] PLA, Unit 76321, Guangzhou 510500, Peoples R China
来源：
7TH INTERNATIONAL CONFERENCE ON COMPUTER-AIDED INDUSTRIAL DESIGN & CONCEPTUAL DESIGN | 2006年
关键词：
complex electronic system; DFT; vertical testability design;
D O I：
暂无
中图分类号：
TP18 [人工智能理论];
学科分类号：
081104 ; 0812 ; 0835 ; 1405 ;
摘要：
It mainly studies the testability design and analysis technology for complex electronic system for meeting the needs of design and product work and service work during using. It lucubrates testability design requests for the segments such as the partition for maintain level, the interface of test data, the interface of UUT and test equipments, during the processes of development, manufacturing and using, etc. The study is important to improve the testability level and realize integral test for electronic products.
引用
收藏
页码：592 / 595
页数：4
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