An adaptive wavelet-based approach for non destructive evaluation applications

被引:0
|
作者
Bucci, OM [1 ]
Crocco, L [1 ]
Isernia, T [1 ]
Pascazio, V [1 ]
机构
[1] Univ Naples Federico II, Dipartimento Ingn Elettron & Telecomun, I-80125 Naples, Italy
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中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In electromagnetic inverse scattering problems the 'optimal' representation of the unknown is a crucial task in the view of an efficient exploitation of the limited available information. With reference to the particular case of detection of defects in homogeneous materials, a non linear inversion technique taking advantage of multiresolution features of wavelet expansions is presented. Numerical examples confirm the effectiveness of the proposed adaptive approach.
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页码:1756 / 1759
页数:4
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