A new quasi-3D simulation technique to verify the high-voltage level-shifting circuit by divided RESURF structure is proposed. It simulates the 3D performances of the structure by combining the devices paralleled to plane x-y and plane y-z with the circuit analysis advanced application module of Medici. The punch-through effect and parasitic n-MOST effect in the structure are analyzed and simulated. The results prove that only the parasitic n-MOST has been developed in this structure. The optimized parameters of the divided RESURF structure can be proposed to suppress the parasitic n-MOST effect. The quasi-3D simulation technique has many merits, such as computing quickly, no demand on the high-end computer terminals and operating easily.
机构:
State Key Laboratory of Electronic Thin Films and Integrated Devices,University of Electronic Science and Technology of ChinaState Key Laboratory of Electronic Thin Films and Integrated Devices,University of Electronic Science and Technology of China
机构:
State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of ChinaState Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China
机构:
State Key Laboratory of Electronic Thin Films and Integrated Devices,University of Electronic Science and Technology of ChinaState Key Laboratory of Electronic Thin Films and Integrated Devices,University of Electronic Science and Technology of China
孔谋夫
陈星弼
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机构:
State Key Laboratory of Electronic Thin Films and Integrated Devices,University of Electronic Science and Technology of ChinaState Key Laboratory of Electronic Thin Films and Integrated Devices,University of Electronic Science and Technology of China