Increasing the accuracy of atomic-fluorescence analysis

被引：0
|
作者：
Rukin, EM
机构：
来源：
MEASUREMENT TECHNIQUES | 2000年 / 43卷 / 05期
关键词：
Line Source; Inverse Fourier Transform; Scattered Radiation; Continuous Source; Nonferrous Metallurgy;
D O I：
10.1007/BF02503656
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Allowance for scattered light using an additional continuous-spectrum source is considered. The effect of light-pulse rise and fall time on analysis accuracy is evaluated. An atomic-fluorescence analyzer is proposed.
引用
收藏
页码：417 / 421
页数：5
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