Microwave Meissner screening properties of proximity-coupled topological-insulator / superconductor bilayers

被引:3
|
作者
Bae, Seokjin [1 ]
Lee, Seunghun [1 ,2 ]
Zhang, Xiaohang [1 ,2 ]
Takeuchi, Ichiro [1 ,2 ]
Anlage, Steven M. [1 ]
机构
[1] Univ Maryland, Dept Phys, Maryland Quantum Mat Ctr, College Pk, MD 20742 USA
[2] Univ Maryland, Dept Mat Sci & Engn, College Pk, MD 20742 USA
关键词
SURFACE IMPEDANCE; PENETRATION DEPTH; THIN-FILMS; DIELECTRIC RESONATORS; MAGNETIC-FIELD; STATES;
D O I
10.1103/PhysRevMaterials.3.124803
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The proximity-coupled topological-insulator / superconductor (TI/SC) bilayer system is a representative system to realize topological superconductivity. In order to better understand this unique state and enable future applications of the TI/SC bilayer, a comprehensive characterization and understanding of the microscopic properties of the bilayer are required. In this work, a microwave Meissner screening study, which exploits a high-precision microwave resonator technique, is conducted on the SmB6/YB6 thin-film bilayers as an example TI/SC system. The study reveals spatially dependent electrodynamic screening response of the TI/SC system that is not accessible to other techniques, from which the corresponding microscopic properties of a TI/SC bilayer can be obtained. The TI thickness dependence of the effective penetration depth suggests the existence of a bulk insulating region in the TI layer. The spatially dependent electrodynamic screening model analysis provides an estimate for the characteristic lengths of the TI/SC bilayer: normal penetration depth, normal coherence length, and the thickness of the surface states.
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页数:9
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