Imaging EQE in CIGS solar cells with high spatial resolution

被引:0
|
作者
Tennyson, Elizabeth M. [1 ,2 ]
Frantz, Jesse A. [3 ]
Myers, Jason D. [3 ]
Sanghera, Jas S. [3 ]
Bekele, Robel Y. [4 ]
Na, Suok-Min [5 ]
Leite, Marina S. [1 ,2 ]
机构
[1] Univ Maryland, Dept Mat Sci & Engn, College Pk, MD 20742 USA
[2] Univ Maryland, Inst Res Elect & Appl Phys, College Pk, MD 20742 USA
[3] US Naval Res Lab, Washington, DC USA
[4] Univ Res Fdn, Greenbelt, MD USA
[5] Univ Maryland, Dept Aerosp Engn, College Pk, MD 20742 USA
关键词
solar energy; thin-film; CIGS; scanning probe microscopy; optoelectronic properties; CU(IN; GA)SE-2; THIN-FILMS; EFFICIENCY;
D O I
暂无
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
We use sub-micron scanning photocurrent microscopy to spatially resolve variations in the collection properties of CIGS thin-film solar cells made from a quaternary target. Spectrally dependent photocurrent measurements show remarkable variations in the current collection properties of the grain boundaries and grain cores. We combine EQE maps with Raman and EBSD scans to infer a direct correlation between the electrical and structural properties of the material comprising these polycrystalline devices.
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页数:4
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