Z-scan and four-wave mixing characterization of semiconductor cadmium chalcogenide nanomaterials

被引：8
|
作者：
Yang, Qiguang [1 ]
Seo, JaeTae
Creekmore, Santiel
Tan, Guolong
Brown, Herbert
Ma, Seong Min
Creekmore, Linwood
Jackson, Ashley
Skyles, Tifney
Tabibi, Bagher
Wang, Huitian
Jung, SungSoo
Namkung, Min
机构：
[1] Hampton Univ, Dept Phys, Hampton, VA 23668 USA
[2] Nanjing Univ, Dept Phys, Natl Lab Solid State Microstruc, Nanjing 210093, Peoples R China
[3] Korea Res Inst Stand & Sci, Taejon 305600, South Korea
[4] NASA, Goddard Space Flight Ctr, Astrochem Branch, Greenbelt, MD 20771 USA
来源：
SEVENTH INTERNATIONAL CONFERENCE ON NEW PHENOMENA IN MESOSCOPIC STRUCTURES AND FIFTH INTERNATIONAL CONFERENCE ON SURFACES AND INTERFACES OF MESOSCOPIC DEVICES, 2005 | 2006年 / 38卷
关键词：
D O I：
10.1088/1742-6596/38/1/035
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The possible physical origin of third-order nonlinearity of cadmium chalcogenide (Te, Se, and S) semiconductor nanocrystals were discussed based on the results of both Z-scan and degenerate four-wave mixing spectroscopies at 532, 775, 800, and 1064 nm in nanosecond, picosecond, and femtosecond time scale for nonlinear photonic applications.
引用
收藏
页码：144 / 147
页数：4
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