REBCO FCL Modelling: Influence of Local Critical Current Non-Uniformities on Overall Behavior for Various Tape Architectures

被引：10

作者：

Badel, A. ^{[1
]}

Escamez, G. ^{[1
,2
]}

Tixador, P. ^{[1
]}

机构：

[1] Univ Grenoble Alpes, CNRS, G2Elab, Inst Neel, F-38000 Grenoble, France

[2] Nexans France, F-92587 Clichy, France

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 2015年 / 25卷 / 03期

关键词：

Superconducting fault current limiters; superconducting transition modeling;

D O I：

10.1109/TASC.2014.2371926

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

REBCO Coated Conductors with very good characteristics are now easily available in hundreds of meter lengths. Their use for resistive fault current limiter applications is constrained by the variations of the critical current density along the length, which may lead to the appearance of destructive hotspot under ohmic fault conditions. In this paper, we present a light 1D model of Coated Conductor FCL that take into account the critical current density variations along the length, assuming a homogenous temperature in the tape cross section. This assumption is discussed by comparing simulation results for a case of quench propagation under constant current with those obtained with a more refined 2D model. The new 1D model is then compared to small scale experiments of DC FCL with very short transient. Finally it is used to study the influence of tape architecture on the behavior of a MW-class DC Fault Current Limiter with critical current non-uniformities and select a suitable candidate architecture for the realization of such device.

引用

页数：4