High resolution and high sensitivity near-field optical microscope

被引:1
|
作者
Freyland, JM [1 ]
Eckert, R [1 ]
Heinzelmann, H [1 ]
机构
[1] Ctr Suisse Elect & Microtech SA, CH-2007 Neuchatel, Switzerland
关键词
D O I
10.1016/S0167-9317(00)00398-1
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have built a multi-purpose optical microscope by integrating a conventional confocal laser microscope (CLM) and a state of the art scanning near-field optical microscope (SNOM) with a conventional inverted optical microscope. The setup is designed for fluorescence imaging of delicate samples at very low signal levels as found in applications in the Life Sciences. An active-feedback closed-loop x-y-scanner with a scan range of 100 x 100 mu m enables the instrument to rapidly record large area scans using confocal microscopy. Interesting areas of the samples identified by such a scan can subsequently be investigated with sub-diffraction limited resolution. The near-field part of the instrument is based on standard optical fibre probes and a non-optical, tuning fork shear-force technique for maintaining the probe-sample distance. An extremely sensitive feedback working on the phase rather than the amplitude of the tuning fork response is used in order not to damage delicate biological samples. First results on mu-contact printed rabbit IgG and single molecule fluorescence are reported.
引用
收藏
页码:653 / 656
页数:4
相关论文
共 50 条
  • [1] Near-field optical detection of atoms with high sensitivity and high spatial resolution
    Ito, H
    Totsuka, K
    Kawamura, T
    Yatsui, T
    Ohtsu, M
    [J]. CLEO(R)/PACIFIC RIM 2001, VOL I, TECHNICAL DIGEST, 2001, : 514 - 515
  • [2] Enhanced sensitivity near-field scanning optical microscopy at high spatial resolution
    Hamann, HF
    Gallagher, A
    Nesbitt, DJ
    [J]. APPLIED PHYSICS LETTERS, 1998, 73 (11) : 1469 - 1471
  • [3] Implications of high resolution to near-field optical microscopy
    Novotny, L
    Hecht, B
    Pohl, DW
    [J]. ULTRAMICROSCOPY, 1998, 71 (1-4) : 341 - 344
  • [4] Method to produce high-resolution scanning near-field optical microscope probes by beveling optical fibers
    Held, T
    Emonin, S
    Marti, O
    Hollricher, O
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2000, 71 (08): : 3118 - 3122
  • [5] Near-field microwave microscope with improved sensitivity and spatial resolution
    Tselev, A
    Anlage, SM
    Christen, HM
    Moreland, RL
    Talanov, VV
    Schwartz, AR
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2003, 74 (06): : 3167 - 3170
  • [6] High-speed optical near-field photolithography by super resolution near-field structure
    Kuwahara, M
    Nakano, T
    Tominaga, J
    Lee, MB
    Atoda, N
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1999, 38 (9AB): : L1079 - L1081
  • [7] High-resolution lithography with near-field optical microscopy
    Naber, A
    Kock, H
    Fuchs, H
    [J]. SCANNING, 1996, 18 (08) : 567 - 571
  • [8] HIGH-RESOLUTION INTERFEROMETRY IN NEAR-FIELD OPTICAL MICROSCOPY
    BAIDA, F
    BAINIER, C
    COURJON, D
    [J]. MICROSCOPY MICROANALYSIS MICROSTRUCTURES, 1994, 5 (4-6): : 409 - 425
  • [9] THE NEAR-FIELD OPTICAL MICROSCOPE
    VIGOUREUX, JM
    COURJON, D
    [J]. RECHERCHE, 1990, 21 (223): : 959 - 961
  • [10] Numerical study of the resolution in a model near-field optical microscope
    Valencia, C
    Méndez, ER
    [J]. SCATTERING AND SURFACE ROUGHNESS III, 2000, 4100 : 124 - 130