Investigation of Waveguide Mode Profiles of AWGs Using a Low-Coherence Interferometric Method

被引：0

作者：

Wang, Zhipeng ^{[1
]}

Chen, Yung-Jui ^{[1
]}

机构：

[1] Univ Maryland, Dept Comp Sci & Elect Engn, Baltimore, MD 21227 USA

来源：

JOURNAL OF LIGHTWAVE TECHNOLOGY | 2010年 / 28卷 / 01期

关键词：

Diffraction gratings; integrated optics devices; planar waveguides; FLAT SPECTRAL RESPONSE; GRATING MULTIPLEXER; PHASE ERROR; PASSBAND; PERFORMANCE;

D O I：

10.1109/JLT.2009.2036140

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper, we propose and demonstrate a novel method to characterize waveguide mode profiles in arrayed waveguide grating (AWG) devices by utilizing a low-coherence interferometric measurement. Our method calculates the waveguide mode profile from its far-field diffraction pattern obtained by the low-coherence interferometric measurement utilizing AWG as a testing vehicle. The waveguide mode profile and its far-field diffraction pattern follow the Fourier transformation relationship. Detailed formulation and analysis procedures are presented in this paper. Experimental results of waveguide mode profiles for Gaussian waveguides and multimode interference waveguides are also shown. This method is very effective in characterizing complex waveguide designs in advanced AWG devices.

引用

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页码：131 / 140

页数：10

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