Ab Initio Simulation of Band-to-Band Tunneling FETs With Single- and Few-Layer 2-D Materials as Channels

被引:20
|
作者
Szabo, Aron [1 ]
Klinkert, Cedric [1 ]
Campi, Davide [2 ]
Stieger, Christian [1 ]
Marzari, Nicola [2 ]
Luisier, Mathieu [1 ]
机构
[1] Swiss Fed Inst Technol, Integrated Syst Lab, CH-8092 Zurich, Switzerland
[2] Ecole Polytech Fed Lausanne, Lab Theory & Simulat Mat, CH-1015 Lausanne, Switzerland
关键词
2-D materials; ab initio; device simulation; quantum transport; tunneling FET (TFET); FIELD-EFFECT TRANSISTORS;
D O I
10.1109/TED.2018.2840436
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Full-band atomistic quantum transport simulations based on first principles are employed to assess the potential of band-to-band tunneling FETs (TFETs) with a 2-D channel material as future electronic circuit components. We demonstrate that single-layer (SL) transition metal dichalcogenides are not well suited for TFET applications. There might, however, exist a great variety of 2-D semiconductors that have not even been exfoliated yet; this paper pinpoints some of the most promising candidates among them to realize highly efficient TFETs. SL SnTe, As, TiNBr, and Bi are all found to ideally deliver ON-currents larger than 100 mu A/mu m at 0.5-V supply voltage and 0.1 nA/mu m oFF-current value. We showthat going from single to multiple layers can boost the TFET performance as long as the gain from a narrowing bandgap exceeds the loss from the deteriorating gate control. Finally, a 2-D van der Waals heterojunction TFET is revealed to perform almost as well as the best SL homojunction, paving the way for research in optimal 2-D material combinations.
引用
收藏
页码:4180 / 4187
页数:8
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