Thermomechanical Reliability Assessment of Solder Joints in a Photovoltaic Module Operated in a Hot Climate

被引:31
|
作者
Jiang, Nan [1 ]
Ebadi, Abdol Ghaffar [2 ]
Kishore, Kakarla Hari [3 ]
Yousif, Qahtan A. [4 ]
Salmani, Mohammad [5 ]
机构
[1] Zhengzhou Univ Light Ind, Coll Comp & Commun Engn, Zhengzhou 450002, Peoples R China
[2] Islamic Azad Univ, Jouybar Branch, Dept Agr, Jouybar 196151194, Iran
[3] Koneru Lakshmaiah Educ Fdn, Guntur 522502, Andhra Pradesh, India
[4] Univ Al Qadisiyah, Dept Chem, Coll Sci, Al Diwaniyah 10081, Iraq
[5] Payame Noor Univ, Elect & Comp Engn Dept, Tehran 4318314556, Iran
来源
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY | 2020年 / 10卷 / 01期
关键词
Soldering; Mathematical model; Finite element analysis; Creep; Meteorology; Fatigue; Photovoltaic cells; Fatigue life; photovoltaic (PV); reliability; solder joint; thermal cycling; MECHANICAL-PROPERTIES; FATIGUE LIFE; PV MODULE; TEMPERATURE; DEGRADATION; DAMAGE; EVOLUTION; THICKNESS; FAILURE;
D O I
10.1109/TCPMT.2019.2933057
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this article, the fatigue evolution of solder joints in a photovoltaic (PV) module at a hot climate under thermomechanical cycling was evaluated. The finite-element modeling (FEM) simulation results showed that the degradation evolution is very sensitive to the ambient temperature so that with an increase in ambient temperature from 25 degrees C to 75 degrees C, the fatigue life decreased by 34% for the solder joints. A handy equation was also given to predict fatigue life in the mentioned ambient temperature. The simulation outcomes also revealed that with an increase in solder layer thickness, the fatigue life improved, which is due to the lower accumulated strain energy per volume in the solder material. Moreover, SEM micrographs, from the experimental fatigue test, indicated that the damage evolution was accompanied by the appearance of elemental heterogeneity and void coalescence in the solder joints. The X-ray diffraction (XRD) test also showed that the decrease in solder thickness leads to the intensification of intermetallic compounds formation at the interface.
引用
收藏
页码:160 / 167
页数:8
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