Studies of magnetic properties of the stabilizing layer for synthetic antiferromagnetically coupled media

被引：0
|
作者：
Shan, ZS
Bitman, L
Malhotra, SS
Stafford, D
Bian, B
Bertero, G
Xu, YF
Yan, ML
Sellmyer, DJ
机构：
[1] Komag Inc, San Jose, CA 95131 USA
[2] Univ Nebraska, Lincoln, NE 68588 USA
来源：
JOURNAL OF APPLIED PHYSICS | 2003年 / 93卷 / 10期
关键词：
D O I：
10.1063/1.1555794
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The effects of the stabilizing layer thickness and its temperature dependence on the magnetic properties were investigated experimentally. These results were used to analyze the magnetic structure of the thin stabilizing layer and its effect on the coupling strength, which is valuable for improving the design of synthetic antiferromagnetically coupled media. (C) 2003 American Institute of Physics.
引用
收藏
页码：7768 / 7770
页数：3
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