MFM study of NdFeB and NdFeB/Fe/NdFeB thin films

被引：8
|
作者：
Gouteff, PC [1 ]
Folks, L [1 ]
Street, R [1 ]
机构：
[1] Univ Western Australia, Dept Phys, Nedlands, WA 6907, Australia
来源：
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 1998年 / 177卷
关键词：
MFM; NdFeB; thin films; exchange coupling;
D O I：
10.1016/S0304-8853(97)00814-7
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Domain structures of NdFeB thin films, ranging in thickness between 1500 and 29 nm, have been studied qualitatively by magnetic force microscopy (MFM). Samples were prepared using a range of sputtering conditions resulting in differences in properties such as texture, coercivity and magnetic saturation. MFM images of all the films showed extensive interaction domain structures, similar to those observed in nanocrystalline bulk NdFeB. An exchange-coupled NdFeB/Fe/NdFeB trilayer with layer thicknesses 18nm/15nm/18nm, respectively, was also examined using MFM. (C) 1998 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：1241 / 1242
页数：2
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