Developing and Improving Risk Models using Machine-learning Based Algorithms

被引:0
|
作者
Wang, Yan [1 ]
Ni, Xuelei Sherry [1 ]
机构
[1] Kennesaw State Univ, Kennesaw, GA 30144 USA
关键词
Improve Risk Model; Machine Learning;
D O I
10.1145/3299815.3314478
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
The objective of this study is to develop a good risk model for classifying business delinquency by simultaneously exploring several machine learning based methods including regularization, hyper-parameter optimization, and model ensembling algorithms. The rationale under the analyses is firstly to obtain good base binary classifiers (include Logistic Regression (LR), K-Nearest Neighbors (KNN), Decision Tree ( DT), and Artificial Neural Networks (ANN)) via regularization and appropriate settings of hyper-parameters. Then two model ensembling algorithms including bagging and boosting are performed on the good base classifiers for further model improvement. The models are evaluated using accuracy, Area Under the Receiver Operating Characteristic Curve (AUC of ROC), recall, and F1 score via repeating 10-fold cross-validation 10 times. The results show the optimal base classifiers along with the hyper-parameter settings are LR without regularization, KNN by using 9 nearest neighbors, DT by setting the maximum level of the tree to be 7, and ANN with three hidden layers. Bagging on KNN with K valued 9 is the optimal model we can get for risk classification as it reaches the average accuracy, AUC, recall, and F1 score valued 0.90, 0.93, 0.82, and 0.89, respectively.
引用
收藏
页码:281 / 282
页数:2
相关论文
共 50 条
  • [1] Credit Risk Analysis Using Machine-Learning Algorithms
    Alagoz, Gokhan
    Canakoglu, Ethem
    [J]. 29TH IEEE CONFERENCE ON SIGNAL PROCESSING AND COMMUNICATIONS APPLICATIONS (SIU 2021), 2021,
  • [2] Consumer credit-risk models via machine-learning algorithms
    Khandani, Amir E.
    Kim, Adlar J.
    Lo, Andrew W.
    [J]. JOURNAL OF BANKING & FINANCE, 2010, 34 (11) : 2767 - 2787
  • [3] Improving measurements of similarity judgments with machine-learning algorithms
    Stevens, Jeffrey R.
    Saltzman, Alexis Polzkill
    Rasmussen, Tanner
    Soh, Leen-Kiat
    [J]. JOURNAL OF COMPUTATIONAL SOCIAL SCIENCE, 2021, 4 (02): : 613 - 629
  • [4] Improving measurements of similarity judgments with machine-learning algorithms
    Jeffrey R. Stevens
    Alexis Polzkill Saltzman
    Tanner Rasmussen
    Leen-Kiat Soh
    [J]. Journal of Computational Social Science, 2021, 4 : 613 - 629
  • [5] Smartphones dependency risk analysis using machine-learning predictive models
    Giraldo-Jimenez, Claudia Fernanda
    Gaviria-Chavarro, Javier
    Sarria-Paja, Milton
    Bermeo Varon, Leonardo Antonio
    Villarejo-Mayor, John Jairo
    Rodacki, Andre Luiz Felix
    [J]. SCIENTIFIC REPORTS, 2022, 12 (01)
  • [6] Smartphones dependency risk analysis using machine-learning predictive models
    Claudia Fernanda Giraldo-Jiménez
    Javier Gaviria-Chavarro
    Milton Sarria-Paja
    Leonardo Antonio Bermeo Varón
    John Jairo Villarejo-Mayor
    André Luiz Felix Rodacki
    [J]. Scientific Reports, 12
  • [7] Developing Machine-Learning Models to Predict Airfield Pavement Responses
    Gungor, Osman Erman
    Al-Qadi, Imad L.
    [J]. TRANSPORTATION RESEARCH RECORD, 2018, 2672 (29) : 23 - 34
  • [8] Accelerating Machine-Learning Algorithms on FPGAs using Pattern-Based Decomposition
    Karthik Nagarajan
    Brian Holland
    Alan D. George
    K. Clint Slatton
    Herman Lam
    [J]. Journal of Signal Processing Systems, 2011, 62 : 43 - 63
  • [9] Improving the accuracy of machine-learning models with data from machine test repetitions
    Andres Bustillo
    Roberto Reis
    Alisson R. Machado
    Danil Yu. Pimenov
    [J]. Journal of Intelligent Manufacturing, 2022, 33 : 203 - 221
  • [10] Accelerating Machine-Learning Algorithms on FPGAs using Pattern-Based Decomposition
    Nagarajan, Karthik
    Holland, Brian
    George, Alan D.
    Slatton, K. Clint
    Lam, Herman
    [J]. JOURNAL OF SIGNAL PROCESSING SYSTEMS FOR SIGNAL IMAGE AND VIDEO TECHNOLOGY, 2011, 62 (01): : 43 - 63