Modeling of 747 Curves in Magnetic Recording Systems

被引:0
|
作者
Chen, Xinyi [1 ]
Huo, Xing [1 ]
机构
[1] Western Digital Corp, San Jose, CA 95119 USA
关键词
747; curve; areal-density (AD) capability; bit aspect ratio; off-track-capability (OTC); perpendicular magnetic recording; squeeze-to-death (S2D); TRACK DENSITY; CAPABILITY;
D O I
10.1109/TMAG.2019.2932702
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this article, we discuss the models of the 747 test, in particular, the 747 test taken over a range of linear densities. In a comparison study, we fit the 747 curves at three conditions, as well as different upper limits of the track pitch. Based on the comparison result, we present a general model for the 747 curves as a function of linear density. The new proposed model not only improves the accuracy but also extends the applicable scope of the fitting. With the model, we also demonstrate the optimal combinations of track density and linear density for maximizing the off-track-capability (OTC) and squeeze-to-death (S2D), as well as their maximums as a function of areal density.
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页数:10
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