Improved Probing Reliability in Antenna-on-Chip Measurements

被引：12
|
作者：
Liu, Qiang [1 ]
Reniers, Ad C. F. [1 ]
Johannsen, Ulf [1 ]
van Beurden, Martijn C. [1 ]
Smolders, Adrianus Bart [1 ]
机构：
[1] Eindhoven Univ Technol, Dept Elect Engn, NL-5612 AZ Eindhoven, Netherlands
来源：
IEEE ANTENNAS AND WIRELESS PROPAGATION LETTERS | 2018年 / 17卷 / 09期
关键词：
Antenna-on-Chip (AoC); calibration accuracy; millimeter-wave (mm-wave) antenna measurements; mm-wave integrated circuit (IC) measurements; probe radiation; CHALLENGES; SETUP;
D O I：
10.1109/LAWP.2018.2865605
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Antenna-on-Chip (AoC) measurements are mostly performed with on-wafer probes. The connection between the probe tips and antenna under test (AUT) plays a crucial role in influencing the measurement reliability. A tilted probe or a non-planarly packaged AoC can result in floating pin(s) during the landing process of the probe. We have measured the behavior of the input reflection coefficient when a ground-signal-ground probe touches a SHORT calibration standard and the possible contact states are modeled, simulated, and compared with measurements. The analysis demonstrates that the probe will radiate as an antenna, which will make it almost impossible to determine the real AoC characteristics. To improve the probing reliability, it is necessary to determine a reference force to be applied to the AUT. We recommend adding an on-chip SHORT to be integrated with the AoC, which can be aligned with the test pads.
引用
收藏
页码：1745 / 1749
页数：5
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