Intergranular film thickness of self-reinforced silicon carbide ceramics

被引：12
|
作者：
Choi, HJ
Kim, YW
机构：
[1] Korea Inst Sci & Technol, Dept Mat Sci & Engn, Seoul 130650, South Korea
[2] Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 130743, South Korea
来源：
JOURNAL OF THE EUROPEAN CERAMIC SOCIETY | 2004年 / 24卷 / 15-16期
关键词：
SiC; liquid phase sintering; electron microscopy; grain boundaries; interphase;
D O I：
10.1016/j.jeurceramsoc.2003.12.029
中图分类号：
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
The intergranular film of self-reinforced SiC ceramics prepared by hot pressing and further annealing with SiO2-Y2O3 and SiO2-Al2O3 as sintering additives was observed by high-resolution transmission electron microscopy. The film thickness of SiC ceramics with SiO2-Y2O3 was similar to1.2 nm whereas that of ceramics with SiO2-Al2O3 was similar to0.8 nm. Based on the refined continuum model, an explanation on the variation of thickness with sintering additives is given. It seems that the behavior of intergranular glassy film of SiC ceramics is akin to that Of Si3N4 ceramics. (C) 2004 Elsevier Ltd. All rights reserved.
引用
收藏
页码：3795 / 3800
页数：6
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