Analysis of surface composition of isotopic polymer blend based on time-of-flight secondary ion mass spectroscopy

被引：7
|
作者：
Takahara, A [1 ]
Kawaguchi, D
Tanaka, K
Tozu, M
Hoshi, T
Kajiyama, T
机构：
[1] Kyushu Univ, Inst Fundamental Res Organ Chem, Fukuoka 81285812, Japan
[2] Kyushu Univ, Fac Engn, Dept Appl Chem, Higashi Ku, Fukuoka 81285812, Japan
[3] Ulvac Phi Inc, Chigasaki, Kanagawa 2530084, Japan
来源：
APPLIED SURFACE SCIENCE | 2003年 / 203卷
关键词：
time-of-flight-secondary ion mass spectroscopy polystyrene; isotopic blend; surface segregation;
D O I：
10.1016/S0169-4332(02)00748-1
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Surface chemical composition of blend composed of monodisperse polystyrene (hPS) with the number-average molecular weight, M-n, of 19.7k and deuterated monodisperse polystyrene (dPS) with M-n of 847k was analyzed based on time-of-flight secondary ion mass spectroscopy (ToF-SIMS). Although hPS possess higher surface free energy than dPS, ToF-SIMS revealed that hPS was preferentially segregated at the outermost surface of the blend films with various compositions. The surface segregation of hPS can be explained in terms of the molecular weight disparity for both components, i.e., an entropic effect. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：538 / 540
页数：3
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