Interfacial Microstructure and Mechanical Properties of Sn2.5Ag0.7Cu0.1RE0.05Ni/Cu Solder Joint under Thermal Shock

被引:0
|
作者
Zhang Keke [1 ,2 ]
Guo Xingdong [1 ]
Wang Huigai [1 ]
机构
[1] Henan Univ Sci & Technol, Luoyang 471023, Peoples R China
[2] Collaborat Innovat Ctr Nonferrous Met, Henan Key Lab Nonferrous Mat Sci & Proc Technol, Luoyang 471023, Henan Province, Peoples R China
关键词
Sn2.5Ag0.7Cu0.1RE0.05Ni lead-free solder; thermal shock; soldering; interface intermetallic compounds; shear strength; CU;
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
To study the effect of solder process parameters and thermal shock on Sn2.5Ag0.7Cu0.1RE0.05Ni/Cu of soldered joints, the interface intermetallic compounds and strength of the joints were analyzed by SEM, EDS and XRD. The results show that 0.05 wt% Ni addition can refine the primary beta-Sn phase and eutectic of the Sn2.5Ag0.7Cu0.1RE solder alloy. The maximum shear strength is 26.9 MPa from the joint at the soldering temperature of 270 degrees C for soldering time 240 s, which increases by 8.9% compared with Sn2.5Ag0.7Cu0.1RE/Cu joint. The average thickness of the Sn2.5Ag0.7Cu0.1RE0.05Ni/Cu joint rises with the increasing of temperature and time. The interface roughness of the joint increases and then decreases. The interface IMC of the solder joints grows irregularly with the rising of thermal shock cycle. At the same time, the strength of the joint decreases. The 0.05 wt% Ni addition can inhibit the decrease of the reliability of soldered joint in the process of the thermal shock.
引用
收藏
页码:1353 / 1358
页数:6
相关论文
共 14 条
  • [1] Effects of small amounts of Ni/P/Ce element additions on the microstructure and properties of Sn3.0Ag0.5Cu solder alloy
    Dong, Wenxing
    Shi, Yaowu
    Lei, Yongping
    Xia, Zhidong
    Guo, Fu
    [J]. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2009, 20 (10) : 1008 - 1017
  • [2] Li Chenyang, 2012, T CHINA WELDING I, V33, P9
  • [3] Li Jun, 2004, Chinese Journal of Electron Devices, V27, P537
  • [4] IMC formation on BGA package with Sn-Ag-Cu and Sn-Ag-Cu-Ni-Ge solder balls
    Lin, Kwang-Lung
    Shih, Po-Cheng
    [J]. JOURNAL OF ALLOYS AND COMPOUNDS, 2008, 452 (02) : 291 - 297
  • [5] Evolutions of the interface and shear strength between SnAgCu-xNi solder and Cu substrate during isothermal aging at 150°C
    Liu, Ping
    Yao, Pei
    Liu, Jim
    [J]. JOURNAL OF ALLOYS AND COMPOUNDS, 2009, 486 (1-2) : 474 - 479
  • [6] A review of mechanical properties of lead-free solders for electronic packaging
    Ma, Hongtao
    Suhling, Jeffrey C.
    [J]. JOURNAL OF MATERIALS SCIENCE, 2009, 44 (05) : 1141 - 1158
  • [7] Meng Gongge, 2010, T CHINA WELDING I, V31, P85
  • [8] Interface reaction between copper and molten tin-lead solders
    Prakash, KH
    Sritharan, T
    [J]. ACTA MATERIALIA, 2001, 49 (13) : 2481 - 2489
  • [9] [王春青 Wang Chunqing], 2011, [焊接学报, Transactions of the China Welding Institution], V32, P1
  • [10] [王俭辛 Wang Jianxin], 2006, [焊接学报, Transactions of the China Welding Institution], V27, P53