Analysis of Advanced Circuits for SET Measurement

被引：0

作者：

Liu, Rui ^{[1
]}

Evans, Adrian ^{[2
]}

Wu, Qiong ^{[1
]}

Li, Yuanqing ^{[1
]}

Chen, Li ^{[1
]}

Wen, Shi-Jie ^{[3
]}

Wong, Rick ^{[3
]}

Fungi, Rita ^{[3
]}

机构：

[1] Univ Saskatchewan, Dept Elect & Comp Engn, Saskatoon, SK S7N 0W0, Canada

[2] IROC Technol, Grenoble, France

[3] Cisco Syst, San Jose, CA USA

来源：

2015 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS) | 2015年

关键词：

single event transient (SET); SINGLE-EVENT TRANSIENTS; INVERTERS; CHAINS; RATES;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Single Event Transients (SETs) are a growing concern in advanced integrated circuits yet techniques to accurately characterize the cross-section and pulse width of SETs are less mature than those for measuring SEUs. We present four circuits for measuring SETs, an analysis of their capabilities and the subtleties in their implementation. Post-layout circuit simulation results are presented for a test-chip implemented in 28 nm FSDOI technology and integrating these detectors.

引用

页数：7

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