The effect of substrate misorientation on the evolution of surface morphology in epitaxially grown CaF2/Si(111) heterostructures

被引：0
|
作者：
Kim, BM [1 ]
Soss, SR [1 ]
Overney, RM [1 ]
Schowalter, LJ [1 ]
机构：
[1] RENSSELAER POLYTECH INST, DEPT PHYS, TROY, NY 12180 USA
来源：
EVOLUTION OF EPITAXIAL STRUCTURE AND MORPHOLOGY | 1996年 / 399卷
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中图分类号：
T [工业技术];
学科分类号：
08 ;
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页码：177 / 182
页数：6
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