Importance of frequency-dependent grain boundary scattering in nanocrystalline silicon and silicon-germanium thermoelectrics

被引:59
|
作者
Hua, Chengyun [1 ]
Minnich, Austin J. [1 ]
机构
[1] CALTECH, Div Engn & Appl Sci, Pasadena, CA 91125 USA
基金
美国国家科学基金会;
关键词
grain boundary scattering; Monte Carlo simulations; nanocrystalline thermoelectrics; FIGURE-OF-MERIT; BULK; PERFORMANCE;
D O I
10.1088/0268-1242/29/12/124004
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Nanocrystalline silicon and silicon-germanium alloys are promising thermoelectric (TE) materials that have achieved substantially improved figure of merits compared to their bulk counterparts. This enhancement is typically attributed to a reduction in lattice thermal conductivity by phonon scattering at grain boundaries. However, further improvements are difficult to achieve because grain boundary scattering is poorly understood, with recent experimental observations suggesting that the phonon transmissivity may depend on phonon frequency rather than being constant as in the commonly used gray model. Here, we examine the impact of frequency-dependent grain boundary scattering in nanocrystalline silicon and silicon-germanium alloys in a realistic 3D geometry using frequency-dependent variance-reduced Monte Carlo simulations. We find that the grain boundary may not be as effective as predicted by the gray model in scattering certain phonons, with a substantial amount of heat being carried by low frequency phonons with mean free paths longer than the grain size. Our result will help guide the design of more efficient TEs.
引用
收藏
页数:8
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