Mode analysis of low frequency dielectric losses in surface stabilized ferroelectric liquid crystal

被引:2
|
作者
Wang, JM [1 ]
Kim, JJ
机构
[1] Korea Adv Inst Sci & Technol, Dept Phys, Taejon 305701, South Korea
[2] Korea Adv Inst Sci & Technol, Ctr Mol Sci, Taejon 305701, South Korea
关键词
low frequency mode; dielectric relaxation; ferroelectric liquid crystal; Tikhonov regularization;
D O I
10.1080/00150190008229575
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Low frequency dielectric constant data of a surface stabilized ferroelectric liquid crystal (SSFLC) sample was analyzed by use of the Tikhonov regularization method to confirm three distinctive modes of relaxation corresponding to the X-mode, D-mode, and L-mode. The mode dependence on the probe field strength was studied in detail for two different cases of surface treatments: one with the indium tin oxide (ITO) coating only and the other with polyimide dressing and rubbing alignment on top of the ITO coating. Origins of the three relaxation modes were discussed on the basis of the observed effects of the different surface treatments.
引用
收藏
页码:51 / 59
页数:9
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