The influence of thermal annealing on the morphology of sexithienyl thin films

被引：0
|
作者：
Viville, P
Lazzaroni, R
Bredas, JL
Moretti, P
Samori, P
Biscarini, F
机构：
[1] Consiglio Nazl Ric, Ist Spettroscopia Mol, I-40129 Bologna, Italy
[2] Univ Bologna, Dipartmento Fis, I-40126 Bologna, Italy
[3] Univ Mons, Serv Chim Mat Nouveaux, Ctr Rech Elect & Photon Mol, B-7000 Mons, Belgium
来源：
ADVANCED MATERIALS | 1998年 / 10卷 / 01期
关键词：
D O I：
10.1002/(SICI)1521-4095(199801)10:1<57::AID-ADMA57>3.0.CO;2-0
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
alpha-Sexithiophene (T6) thin films become smooth and featureless when annealed at temperatures above 160 degrees C. (The Figure shows a typical film before (left) and after (right) being annealed for 20 min at 170 degrees C.) This change in morphology is characterized in terms of the roughness exponent and it is suggested that the threshold temperature represents the onset of fast diffusion of T6 molecules on the surface.
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页码：57 / +
页数：5
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