A histogram based AM-BIST algorithm for ADC characterization using imprecise stimulus

被引：0
|
作者：
Parthasarathy, KL [1 ]
Le, J [1 ]
Kuyel, T [1 ]
Chen, DG [1 ]
Geiger, R [1 ]
机构：
[1] Iowa State Univ, Dept Elect & Comp Engn, Ames, IA 50011 USA
来源：
2002 45TH MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL II, CONFERENCE PROCEEDINGS | 2002年
关键词：
D O I：
暂无
中图分类号：
TP18 [人工智能理论];
学科分类号：
081104 ; 0812 ; 0835 ; 1405 ;
摘要：
A new method enabling the use of stationary non-linear signals has been proposed for testing the linearity of high resolution ADCs. With this method, linearity requirement of the source can be dramatically relaxed and faster sources can be utilized to reduce the test time and increase test coverage for the ADC. Preliminary simulation results show that with a 5-bit linear input signal, the trip points of a 11-bit Flash ADC can be identified to better than 0.5LSB and by incorporating a built-in calibration circuit, the trip point error can be decreased from an uncalibrated 15 LSB level (7-bit performance) to less than 0.5 LSB (11-bit performance) or better.
引用
收藏
页码：274 / 277
页数：4
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